| /external/llvm/test/CodeGen/X86/ |
| sse41.ll | 190 ; X32: ptest %xmm1, %xmm0
194 ; X64: ptest %xmm1, %xmm0
202 ; X32: ptest %xmm1, %xmm0
206 ; X64: ptest %xmm1, %xmm0
214 ; X32: ptest %xmm1, %xmm0
218 ; X64: ptest %xmm1, %xmm0
|
| /prebuilt/darwin-x86/toolchain/i686-android-linux-4.4.3/lib/gcc/i686-android-linux/4.4.3/include/ |
| mmintrin-common.h | 24 /* Common definition of the ROUND and PTEST intrinsics that are shared
|
| /prebuilt/linux-x86/toolchain/i686-android-linux-4.4.3/lib/gcc/i686-android-linux/4.4.3/include/ |
| mmintrin-common.h | 24 /* Common definition of the ROUND and PTEST intrinsics that are shared
|
| /prebuilt/linux-x86/toolchain/i686-linux-glibc2.7-4.4.3/lib/gcc/i686-linux/4.4.3/include/ |
| mmintrin-common.h | 24 /* Common definition of the ROUND and PTEST intrinsics that are shared
|
| /external/qemu/target-i386/ |
| ops_sse_header.h | 287 DEF_HELPER_2(glue(ptest, SUFFIX), void, Reg, Reg)
|
| translate.c | [all...] |
| /external/llvm/lib/Target/X86/ |
| X86ISelLowering.h | 230 // PTEST - Vector bitwise comparisons
231 PTEST,
[all...] |
| X86InstrFragmentsSIMD.td | 97 def X86ptest : SDNode<"X86ISD::PTEST", SDTX86CmpPTest>;
|
| X86ISelLowering.cpp | [all...] |
| X86InstrSSE.td | [all...] |
| /external/v8/src/ia32/ |
| assembler-ia32.h | 985 void ptest(XMMRegister dst, XMMRegister src);
[all...] |
| disasm-ia32.cc | [all...] |
| assembler-ia32.cc | 2524 void Assembler::ptest(XMMRegister dst, XMMRegister src) { function in class:v8::internal::Assembler
[all...] |
| /external/llvm/test/MC/X86/ |
| x86-32-coverage.s | [all...] |
| /prebuilt/sdk/tools/linux/ |
| llvm-rs-cc | |
| /external/qemu/ |
| i386-dis.c | [all...] |
| /prebuilt/linux-x86/toolchain/i686-android-linux-4.4.3/bin/ |
| i686-android-linux-as | |
| i686-android-linux-objdump | |
| /prebuilt/linux-x86/toolchain/i686-android-linux-4.4.3/i686-android-linux/bin/ |
| as | |
| objdump | |
