Lines Matching refs:TEST
58 TEST(0) {
84 TEST(1) {
121 TEST(2) {
167 TEST(3) {
221 TEST(4) {
222 // Test the VFP floating point instructions.
295 // Test vabs.
303 // Test vneg.
356 TEST(5) {
357 // Test the ARMv7 bitfield instructions.
392 TEST(6) {
393 // Test saturating instructions.
503 TEST(7) {
504 // Test vfp rounding modes.
612 TEST(8) {
613 // Test VFP multi load/store with ia_w.
723 TEST(9) {
724 // Test VFP multi load/store with ia.
838 TEST(10) {
839 // Test VFP multi load/store with db_w.
949 TEST(11) {
950 // Test instructions using the carry flag.
967 // Test HeapObject untagging.
978 // Test corner cases.
1014 TEST(12) {
1015 // Test chaining of label usages within instructions (issue 1644).
