/development/samples/Support7Demos/src/com/example/android/supportv7/widget/ |
DrawerLayoutActivity.java | 42 * <a href="https://www.google.com/design/spec/patterns/navigation-drawer.html">Material design 155 // https://www.google.com/design/spec/patterns/navigation-drawer.html#navigation-drawer-specs
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/external/antlr/antlr-3.4/gunit-maven-plugin/src/main/java/org/antlr/mojo/antlr3/ |
GUnitExecuteMojo.java | 83 * A set of patterns for matching files from the sourceDirectory that 91 * A set of exclude patterns.
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/external/apache-xml/src/main/java/org/apache/xalan/templates/ |
DecimalFormatProperties.java | 371 * and negative sub patterns in a pattern; the default value is the 384 * and negative sub patterns in a pattern; the default value is the
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/external/apache-xml/src/main/java/org/apache/xpath/axes/ |
DescendantIterator.java | 33 import org.apache.xpath.patterns.NodeTest; 37 * descendant, descendant-or-self, or "//foo" patterns.
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/external/chromium-trace/catapult/dashboard/dashboard/ |
add_point_test.py | 155 id='my_sheriff1', email='a@chromium.org', patterns=['*/*/*/dom']).put() 263 id='ref_sheriff', email='a@chromium.org', patterns=['*/*/*/*']).put() 277 id='ref_sheriff', email='a@chromium.org', patterns=['*/*/*/*']).put() 290 id='ref_sheriff', email='a@chromium.org', patterns=['*/*/*/*']).put() 497 patterns=['ChromiumPerf/*/*/jslib']).put() 500 patterns=['*/*/image_benchmark/*', '*/*/scrolling_benchmark/*']).put() 561 patterns=['ChromiumPerf/*/dromaeo/jslib']).put() 564 patterns=['*/*image_benchmark/*', '*/*/scrolling_benchmark/*']).put() [all...] |
migrate_test_names_test.py | 251 patterns=['*/mac/*/*/r_op_b']).put() 260 patterns=['*/win7/*/*/r_op_b']).put()
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/external/chromium-trace/catapult/third_party/gsutil/gslib/commands/ |
du.py | 73 -X Similar to -e, but excludes patterns from the given file. The 74 patterns to exclude should be one per line.
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/external/clang/lib/Format/ |
BreakableToken.h | 227 // patterns like 230 // We could also support such patterns by special casing the first line
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/external/clang/test/CodeGenObjC/ |
arc-captured-32bit-block-var-layout.m | 25 // The patterns here are a sequence of bytes, each saying first how 30 // All of these patterns start with 01 3x because the block header on
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arc-captured-block-var-layout.m | 25 // The patterns here are a sequence of bytes, each saying first how 30 // All of these patterns start with 01 3x because the block header on
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/external/deqp/doc/testspecs/GLES31/ |
functional.tessellation.txt | 90 winding mode specified in the TES. The patterns drawn are simple and verified by 115 gl_TessLevel*[] cases draw simple all-white patterns and are verified as such.
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/external/eclipse-basebuilder/basebuilder-3.6.2/org.eclipse.releng.basebuilder/plugins/org.eclipse.test.performance.ui/ |
readme.html | 55 [highlight <buildid patterns>] [scenario.pattern <scenario prefix 56 patterns>] [-fingerprints][-scenarioresults][-current.prefix <comma-separated list of build id prefixes>][-baseline.prefix <comma-separated list of build id prefixes>]</b></LI></OL><br> Parameter descriptions:
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/external/google-breakpad/src/testing/gtest/include/gtest/ |
gtest-typed-test.h | 87 // Type-parameterized tests are abstract test patterns parameterized 125 // Now the tricky part: you need to register all test patterns before
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/external/gtest/include/gtest/ |
gtest-typed-test.h | 87 // Type-parameterized tests are abstract test patterns parameterized 125 // Now the tricky part: you need to register all test patterns before
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/external/guava/guava/src/com/google/common/hash/ |
HashFunction.java | 66 * real-world data, which tends to contain many hidden patterns and clumps. The goal 67 * of a good hash function is to stamp these patterns out as thoroughly as possible.
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/external/icu/icu4c/source/i18n/ |
affixpatternparser.h | 228 * DecimalFormatPatternParser to parse a format pattern. Affix patterns 230 * and suffix. This method expects affix patterns strings to be in the
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reldtfmt.h | 191 * Return a single pattern string generated by combining the patterns for the 218 * the new patterns)
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/external/icu/icu4c/source/i18n/unicode/ |
msgfmt.h | 77 * <p>An argument might have a "complex" type with nested MessageFormat sub-patterns. 101 * <h4><a name="patterns">Patterns and Their Interpretation</a></h4> 103 * <code>MessageFormat</code> uses patterns of the following form: 454 * Patterns and their interpretation are specified in the 455 * <a href="#patterns">class description</a>. 775 * pattern. Standard patterns treat all apostrophes as 784 * between patterns having different quoting semantics. [all...] |
/external/icu/icu4c/source/test/intltest/ |
trnserr.cpp | 183 errln("FAIL: Created a UnicodeSet based on bad patterns."); 221 errln("FAIL: Was not able to create a good UnicodeSet based on valid patterns.");
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/external/icu/tools/srcgen/resources/ |
replacements.txt | 103 * The C/POSIX character classes are also available in UnicodeSet patterns, 104 * using patterns like [:graph:] or \p{graph}.
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/external/llvm/include/llvm/ADT/ |
DepthFirstIterator.h | 210 // Provide an accessor method to use them in range-based patterns. 258 // Provide an accessor method to use them in range-based patterns.
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/external/llvm/lib/Target/AMDGPU/ |
VIInstructions.td | 105 // SMEM Patterns 116 // Patterns for global loads with no offset
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/external/llvm/utils/TableGen/ |
DAGISelMatcherGen.cpp | 156 // We need to produce the matcher tree for the patterns source pattern. To do 160 // target, there should be no type comparisons at all for integer patterns! 568 // TODO: Complex patterns can't have output glues, if they did, we'd want 725 // which it gives special status to instructions with patterns that Pat<> 790 // multiple child patterns to cover them all. However, ComplexPattern [all...] |
/external/llvm/utils/unittest/googletest/include/gtest/ |
gtest-typed-test.h | 87 // Type-parameterized tests are abstract test patterns parameterized 125 // Now the tricky part: you need to register all test patterns before
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/external/mesa3d/src/gtest/include/gtest/ |
gtest-typed-test.h | 87 // Type-parameterized tests are abstract test patterns parameterized 125 // Now the tricky part: you need to register all test patterns before
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